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First-principles study of Si(111)(31)~(1/2) × (31)~(1/2)-In reconstruction

机译:Si(111)(31)〜(1/2)×(31)〜(1/2)-重建中的第一性原理研究

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摘要

Using first-principles total-energy calculations, structural properties of the Si( 111) (31)~(1/2)× (31)~(1/2)-In reconstruction have been studied. New refined structural model of the reconstruction has been proposed which adopts 17 In atoms and 31 Si atoms. The model is characterized by the reasonably low surface energy and demonstrates good correspondence between simulated and experimental scanning tunneling microscopy images. Calculations reveal semiconducting nature of the model structure in agreement with experiment.
机译:利用第一性原理的总能量计算,研究了Si(111)(31)〜(1/2)×(31)〜(1/2)-In重建的结构性质。提出了一种新的精细的重构结构模型,该模型采用17 In原子和31 Si原子。该模型的特点是表面能相当低,并且证明了模拟和实验扫描隧道显微镜图像之间的良好对应性。计算结果表明模型结构的半导体性质与实验一致。

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  • 来源
    《Surface Science》 |2012年第24期|p.1914-1917|共4页
  • 作者单位

    Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia;

    Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia;

    Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia;

    Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia,School of Natural Sciences, Far Eastern Federal University, 690000 Vladivostok, Russia;

    Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia,School of Natural Sciences, Far Eastern Federal University, 690000 Vladivostok, Russia,Department of Electronics, Vladivostok State University of Economics and Service, 690600 Vladivostok, Russia;

    Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia,School of Natural Sciences, Far Eastern Federal University, 690000 Vladivostok, Russia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    atom-solid interactions; silicon; indium; surface structure; morphology; roughness; topography; scanning tunneling microscopy (STM);

    机译:原子-固体相互作用硅;铟;表面结构形态学;粗糙度地形;扫描隧道显微镜(STM);
  • 入库时间 2022-08-18 03:05:16

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