机译:C_(60)层对Si(111)√31/ 2-Au和Si(111)√31/ 2-Ag表面上Au和Ag薄膜的生长模式和电导率的影响
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia,Far Eastern Federal University, Vladivostok 690950, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia,Far Eastern Federal University, Vladivostok 690950, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia,Far Eastern Federal University, Vladivostok 690950, Russia;
Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041, Russia,Far Eastern Federal University, Vladivostok 690950, Russia;
机译:完整和经Tl改性的Si(111)5×2-Au表面上的C_(60)层生长
机译:勘误:在Ag(111)和Au(111)表面上吸附C_(60)单层的密度泛函研究[Phys。 B 69,165417(2004)版]
机译:C_(60)吸附到Si(111)表面上的一个原子层In膜上
机译:电沉积地表应力和早期膜生长的嵌入式原子模型:AG / AU(111)
机译:锗(111)相变上的铅和铜(111)磁性表面合金上的铁(x)/镍(1-x)的薄膜显微镜观察。
机译:硅原子对Si(111)5×2-Au中金属原子链的结构和电子效应
机译:srRuO3薄膜的逐层生长和生长模式转变 原子级扁平单端srTiO3(111)表面
机译:非弹性散射对ag(111)物理上单层,双层,三层和厚Kr(111)薄膜表面声子色散关系的测定