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Design and Assembly of BGAs and Voiding Requirements: IPC 7095 B

机译:BGA的设计和组装以及要求:IPC 7095 B

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IPC 7095 B "Design and Assembly Process Implementation for BGAs" was released, but already we have started its revision due to our fast-paced, changing industry. This document describes the design and assembly challenges for implementing BGAs and CSPs, inspection, repair and reliability issues associated with BGAs. The critical issue of black pad associated with electroless immersion nickel gold (ENIG) has been described in detail. Target audiences for this document are managers, design and process engineers, as well as operators and technicians who deal with electronics assembly, inspection and repair processes. The intent is to provide useful and practical information to the industry. There were several people who contributed to IPC-7095 development, but IPC recognized key contributors for this document as Dr. Aspandiar of Intel, Rob Rowland of Radisys, Helen Lowe of Celestica, Vern Solberg of Tessera and Linda Woody of Lockheed Martin.
机译:IPC 7095 B“ BGA的设计和组装过程实施”已发布,但由于我们的行业日新月异,我们已经开始对其进行修订。本文档介绍了实现BGA和CSP的设计和组装挑战,与BGA相关的检查,维修和可靠性问题。详细介绍了与化学镀镍金(ENIG)相关的黑色焊盘的关键问题。本文档的目标读者是经理,设计和过程工程师,以及负责电子组装,检查和维修过程的操作员和技术人员。目的是为行业提供有用和实用的信息。有几个人为IPC-7095的开发做出了贡献,但是IPC认可了该文件的主要贡献者,包括Intel的Aspandiar博士,Radisys的Rob Rowland,Celestica的Helen Lowe,Tessera的Vern Solberg和Lockheed Martin的Linda Woody。

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