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Investigation of inhomogeneous barrier height for Au-type 6H-SiC Schottky diodes in a wide temperature range

机译:Au / n型6H-SiC肖特基二极管在较宽温度范围内的非均匀势垒高度研究

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摘要

Curent-Voltage (I-V) properties of Au/6H-SiC/Au Schottky diodes are investigated and results are analised dependent on temperature at 80-400 K range. Fundamental parameters such as ideality factors (n), barrier heights (Phi(bo)), saturation currents (I-o) are calculated for this diode. Also, series resistance (R-s) is calculated with different methods. Richardson curves are plotted for this structure and Richardson constant (A*) is calculated. Results are compared with literature. Gaussian distribution is examined by using barrier inhomogeneity. Parameters belonging to Gaussian disribution are calculated and results are compared with previous studies done by different authors.
机译:研究了Au / 6H-SiC / Au肖特基二极管的电流电压(I-V)特性,并根据80-400 K范围内的温度对结果进行了分析。计算该二极管的基本参数,例如理想因子(n),势垒高度(Phi(bo)),饱和电流(I-o)。而且,串联电阻(R-s)是用不同的方法计算的。为此结构绘制了理查森曲线,并计算了理查森常数(A *)。将结果与文献进行比较。通过使用势垒不均匀性检查高斯分布。计算属于高斯分布的参数,并将结果与​​不同作者的先前研究进行比较。

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