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Architecture and Circuit Techniques for a 1.1-GHz 16-kb Reconfigurable Memory in 0.18-μm CMOS

机译:0.18μmCMOS中的1.1GHz 16kb可重配置存储器的架构和电路技术

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This paper presents the architecture and circuit techniques for a reconfigurable SRAM building block. The memory block can emulate many memory structures including a cache tag or data array, a FIFO, and a simple scratchpad memory. We choose the block size based on the optimal partition size for large SRAM structures, use self-resetting and replica timing circuit techniques, and add flexible status bits and a few hardwired functional blocks to support reconfigurability. A 16-kb prototype design fabricated in a 0.18 μm technology cycles at 1.1 GHz at the nominal 1.8 V supply and room temperature. The additional logic used for reconfigurability consumes 32% of the area and 23% of the power of the memory block. We project that these overhead percentages would fall below 15% and 10%, respectively, for a 64-kb memory.
机译:本文介绍了可重构SRAM构建块的体系结构和电路技术。存储器模块可以模拟许多存储器结构,包括高速缓存标签或数据阵列,FIFO和简单的暂存器存储器。我们根据大型SRAM结构的最佳分区大小选择块大小,使用自复位和复制定时电路技术,并添加灵活的状态位和一些硬接线功能块以支持可重配置性。在标称1.8 V电源和室温下,以0.18μm的工艺制造的16 kb原型设计在1.1 GHz频率下循环。用于可重配置性的附加逻辑消耗了32%的面积和23%的存储块功率。我们预计,对于64 KB内存,这些开销百分比将分别低于15%和10%。

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