Photoluminescence studies of lnGaN/GaN multi-quantum wells

摘要

We report measurements of photoluminescence, photoluminescence excitation spectroscopy and photoluminescence time decay on three MOVPE-grown InGaN/GaN multiple quantum well structures with 13/100 In in the wells and well widths L_z = 1.25, 2.5 and 5.0 nm. The PL spectra are dominated by single emission peaks, together with phonon sidebands spaced by a GaN LO phonon energy (92 meV). The peak energies are red-shifted with respect to energies calculated for exciton recombination in square quantum wells and the wide well sample also shows a significant Stokes shift between emission and absorption. Recombination lifetimes measured at 6 K are energy dependent, increasing as the photon energy is scanned downwards through the emission line. They also depend strongly on well width. On the low energy side of the 5 nm well emission line we measure lifetimes as long as 100 ns. Raising the temperature from 6 to 300 K results in a strong reduction of emission intensity for all samples and reduction of the lifetimes, though by a much smaller factor. The peak positions shift slightly to lower energy but by far less than the shift in the band edge. We consider three different theoretical models in an attempt to interpret this data, an exponential tail state model, a model of localization due to In/Ga segregation within the wells and the quantum confined Stark effect model. The QCSE model appears able to explain most of the data reasonably well, though there is evidence to suggest that, in addition, some degree of localization occurs.