首页> 外国专利> / FABRICATION METHOD FOR HIGH QUALITY INGAN/GAN MULTI-QUANTUM WELLS

/ FABRICATION METHOD FOR HIGH QUALITY INGAN/GAN MULTI-QUANTUM WELLS

机译:/高质量Ingan / GAN多量子井的制造方法

摘要

The present invention, in the manufacturing method of the indium gallium nitride-based well layers and gallium nitride barrier layer is a multiple quantum well which is formed by alternating structure layer, forming a gallium nitride-based barrier relates to a process for the preparation of a multiple quantum well structure layer the indium gallium nitride-based according to the surface of the well layer in the method of the invention characterized in that the treatment with a gas selected from the group consisting of hydrogen, methane and chlorine, has a high quality interface between the light-emitting characteristics significantly improved multiple quantum advance possible to produce a well structure, and can be effectively applied to a light emitting diode.
机译:本发明中,氮化铟镓基阱层和氮化镓阻挡层的制造方法是由交替的结构层形成的多量子阱,形成氮化镓基阻挡层涉及一种制备方法。在本发明的方法中,根据阱层的表面形成基于氮化铟镓的多量子阱结构层,其特征在于用选自氢,甲烷和氯的气体进行的处理具有高质量发光特性之间的界面显着改善,可能产生良好的多重量子前进,从而产生阱结构,并且可以有效地应用于发光二极管。

著录项

  • 公开/公告号KR100342013B1

    专利类型

  • 公开/公告日2002-06-27

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990052898

  • 申请日1999-11-26

  • 分类号H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:34

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