Transient current electric field profiling of single crystal CVD diamond

摘要

The transient current technique (TCT) has been adapted for profiling of the electric field distribution in intrinsic single crystal CVD diamond. It was found that successive hole transits do not appreciably affect the electric field distribution within the sample. Transits of holes can therefore be used to probe the electric field distribution and also the distribution of trapped charge. Electron transits, on the other hand, cause an accumulation of negative charge in the sample. Illumination with blue or green light was shown to lead to accumulation of positive charge. Low concentrations of trapped charge can be detected in diamond using TCT, corresponding to an ionized impurity concentration below N = 10~(10) cm~(-3).