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Theoretical investigation of high-voltage superjunction GaN-based vertical hetero- junction field effect transistor with ununiformly doped buffer to suppress charge imbalance effect

机译:高压超结GaN基垂直异质结场效应晶体管的不均匀掺杂缓冲抑制电荷不平衡效应的理论研究

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摘要

A superjunction GaN-based vertical heterojunction field effect transistor with ununiformly doped buffer (UDSJ-VHFET) is proposed in this paper. In contrast to the conventional superjunction vertical heterojunction field effect transistor (SJ-VHFET), the doping density of n-pillar increases linearly from top to bottom, while the p-pillar is split into three regions: linearly doped top region, uniformly doped middle region and linearly doped bottom region. The ununiform doping profile suppresses the increase of electric field peak due to the imbalanced charge and smooths the electric field distribution, thus leads to an increase of the breakdown voltage (V-br) under charge imbalance condition. Simulation results show that with the doping dose of p-pillar 40% lower (higher) than that of the n-pillar, the V-br and on-state resistance (R-on) of the proposed device are 6863 V and 4.25 m Omega cm(2) (5751 V and 4.32 m Omega cm(2)), comparing with 3205 V and 4.03 m Omega cm(2) (2175 V and 4.10 m Omega cm(2)) for the conventional SJ-VHFET. Additionally, the proposed device shows a V-br of 12280 V and R-on of 4.29 m Omega cm(2) under charge balance condition, comparing with 12874 V and 4.07 m Omega cm(2) for the conventional SJ-VHFET.
机译:本文提出了一种具有非均匀掺杂缓冲器的基于GaN的超结垂直异质结场效应晶体管(UDSJ-VHFET)。与传统的超结垂直异质结场效应晶体管(SJ-VHFET)相比,n柱的掺杂密度从上到下线性增加,而p柱分为三个区域:线性掺杂的顶部区域,均匀掺杂的中间区域区域和线性掺杂的底部区域。不均匀的掺杂轮廓抑制了由于电荷不平衡引起的电场峰值的增加,并使电场分布变得平滑,从而导致在电荷不平衡条件下的击穿电压(V-br)的增加。仿真结果表明,在p柱掺杂剂量比n柱低40%的情况下,该器件的V-br和导通电阻(R-on)分别为6863 V和4.25 m Omega cm(2)(5751 V和4.32 m Omega cm(2)),而传统SJ-VHFET则为3205 V和4.03 m Omega cm(2)(2175 V和4.10 m Omega cm(2))。此外,与传统SJ-VHFET的12874 V和4.07 m Omega cm(2)相比,该器件在电荷平衡条件下的V-br值为12280 V,R-on为4.29 m Omega cm(2)。

著录项

  • 来源
    《Semiconductor science and technology》 |2019年第6期|065012.1-065012.8|共8页
  • 作者单位

    Ningbo Univ, Dept Microelect Sci & Engn, Ningbo 315211, Zhejiang, Peoples R China|Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang 050051, Hebei, Peoples R China|Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China;

    Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang 050051, Hebei, Peoples R China;

    Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang 050051, Hebei, Peoples R China;

    Xian Shiyou Univ, Coll Sci, Xian 710065, Shaanxi, Peoples R China;

    Ningbo Univ, Dept Microelect Sci & Engn, Ningbo 315211, Zhejiang, Peoples R China;

    Ningbo Univ, Dept Microelect Sci & Engn, Ningbo 315211, Zhejiang, Peoples R China|Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang 050051, Hebei, Peoples R China|Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    gallium nitride; vertical heterojunction field effect transistor; superjunction; breakdown voltage; charge imbalance;

    机译:氮化镓;垂直异质结场效应晶体管;超结;击穿电压;电荷不平衡;

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