Method and architecture for fade correction in floating gate radiation dosimeter

摘要

A method and architecture for fade correction to be used as part of a dosimeter integrated on-chip based on FGDOS® floating gate technology is described. The dosimeter includes at least two different types of floating gate radiation sensors: a low dose, high sensitivity floating gate (type 1) and a high dose, low sensitivity floating gate (type 2). Type 1 floating gate is intended for measuring low dose, long term radiation exposure with high accuracy (e.g. personal or occupational dosimetry). Type 2 floating gate is intended for measuring high dose radiation exposure with limited accuracy (e.g. accidental exposure dosimetry). Having a combination of at least these two types of floating gate radiation sensors, dosimeter dynamic range in passive mode (this is, the floating gate radiation sensors do not need to be recharged) is extended.