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in-situ Hydrogenated CVD a-Si:H

机译:原位氢化CVD a-Si:H

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Experimental studies have been carried out on growth and properties of hydrogenated amorphous silicon prepared by alternately repeating thermal chemical- vapor deposition (CVD) from disilane and hydrogen plasma (HP) treatment (referred to as HP treated CVD a-Si:H). It has been found that hydrogen-plasma treatment induces significant structural relaxation of Si network in addition to the passivation of Si dangling bonds. The effective thickness of this passivated layer has been estimated to be 220A.
机译:已经对通过交替重复乙硅烷的热化学气相沉积(CVD)和氢等离子体(HP)处理(称为HP处理的CVD a-Si:H)制备的氢化非晶硅的生长和性能进行了实验研究。已经发现,氢等离子体处理除了钝化了硅的悬空键外,还引起硅网络的显着结构松弛。该钝化层的有效厚度估计为220A。

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