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The measurement of arbitrary linear microwave two-ports

机译:任意线性微波二端口的测量

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The measurement of the scattering parameters of linear but otherwise arbitrary two-ports (active, lossless or dissipative, and reciprocal or non-reciprocal) by means of an interference bridge is described. Since the measured data form circular loci from which the parameters are then derived, known precision curve-fitting techniques are applicable. The various methods available for distinguishing the proper locus from its inverse are discussed. Various methods of balancing the bridge and many of the errors associated with bridge balancing are given. Finally, the deliberate use of bridge imbalance for increasing measurement accuracy is considered.
机译:描述了借助于干涉桥对线性但任意的两个端口(有源,无损或耗散,以及互易或非互易)的散射参数的测量。由于所测量的数据形成圆形轨迹,然后从该轨迹中导出参数,因此可以应用已知的精确曲线拟合技术。讨论了可用于从其反向区中区分适当基因座的各种方法。给出了各种平衡桥的方法以及许多与桥平衡相关的误差。最后,考虑了使用桥不平衡来提高测量精度。

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