THE METHOD OF MEASUREMENT OF THE SCATTERING MATRIX OF REVERSIBLE TWO-PORT MICROWAVES AS WELL AS AUTOMATICALLY SWITCHED OVER THREE GATE ARRANGEMENT FOR MEASUREMENT OF THE SCATTERING MATRIX OF TWO-PORT MICROWAVES

摘要

The method for measuring the S matrix of microwave reversible two-ports with amplitude and phase switched triple-gate reflectometer, to the input gates of which the inciting signal with established frequency is fed, the reflectometer being calibrated by connecting reference reflactances to its output gates, consisting in that after calibration three input reflectances Τ', Τ'', Τ''' of the three-state reflecting system (F3/1) are measured, and then to the output gates of the reflectometer (R) the input gates of the examined reversible two-port (Sx) are connected, to the output gates of which the three-state reflecting system (F3/1) is connected, and then with the reflectometer (R) three input reflectances Τw', Τw'', Τw''' are determined, which correspond with the input reflectances Τ', Τ'', Τ''' of the three-state reflecting system (F3/1), the input reflectance of the examined two-port opened at the output Τw+ and the input reflectance of the examined two-port closed at the output Τw- are determined, and the terms of the S matrix of the examined two-port are computed in accordance with the following relation: - reflection coefficient with the second gates matched IMAGE - transmittance with the second gates matched IMAGEIMAGE