Calibration and De-Embedding of Microwave Measurements Using Any Combination of One- or Two-Port Standards

摘要

The study is made of the determination of the error two-ports in microwave and millimeter-wave measurements using known calibration standards. New explicit equations have been derived which allow the use of any combination of standards described with their S-parameters. For singularity reasons different equations are needed depending on the type of the standards. The question of how many standards are really needed is also studied. According to the results, three are needed, no matter if they are one- or two-ports and reciprocal or not. There is, however, a description of a new method that uses only two standards as far as the symmetrical measurement fixture is concerned. A method is shown to use redundant equations to reduce the errors in over-determined problems. A calibration and de-embedding program CADEP has been written to be used with the HP 8409C network analyzer and the circuit design program APLAC.