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Viewing Solder Joint Cracks in X-Ray

机译:在X射线中查看焊点裂纹

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MOST OF MY columns have attempted to discuss the "typical," and often more obvious, solder joint failures that can be seen using x-ray inspection. This is usually the main and most important function of this type of analysis. Nondestructive inspection of cracks within solder joints or components is also desirous, however, but this is much more difficult to evaluate optically or by x-ray. Even for those joints that are not optically hidden, optical inspection for cracks is likely limited to the very end of the termination and requires a mostly edge-on view at a reasonable magnification (FIGURE 1) to have the best chance of seeing a crack failure. When inspecting fully populated boards, achieving this level of magnification and orientation may be difficult to do optically, and any cracks present will need to be distinct by showing a separation in the joint. If the two halves of the cracked solder are still touching, then analysis may be almost impossible to make. Furthermore, such a crack will be at the end of the termination and not necessarily extending further back into the joint - for example, into the heel fillet of a QFP, which is more crucial to joint integrity. This may mean a cosmetic issue is seen on one joint, and the actual fault may remain hidden elsewhere.
机译:我的大多数专栏都试图讨论使用X射线检查可以看到的“典型”的,通常更明显的焊点故障。这通常是此类分析的主要和最重要的功能。还希望对焊点或组件内的裂纹进行非破坏性检查,但这要用光学或X射线来评估要困难得多。即使对于那些没有被光学隐藏的接缝,对裂纹的光学检查也可能仅限于终端的末端,并且需要以合理的放大倍数(图1)进行大部分边缘观察,以最大程度地看到裂纹故障。在检查完全填充的电路板时,可能很难通过光学方式达到此放大倍数和方向,并且需要通过在接缝处分离来区分存在的裂纹。如果破裂的焊料的两半仍在接触,则可能几乎无法进行分析。此外,这样的裂纹将出现在端接的末端,而不必再进一步延伸回接缝中,例如延伸至QFP的后跟圆角,这对于接缝的完整性更为关键。这可能意味着在一个关节上看到了装饰性问题,而实际的故障可能仍然隐藏在其他位置。

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