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首页> 外文期刊>Plasma Chemistry and Plasma Processing >Synthesis and Characterization of Nanostructured a-C:H (Hydrogenated Amorphous Carbon) Thin Films by Gaseous Thermionic Vacuum Arc (G-TVA) Deposition Technique
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Synthesis and Characterization of Nanostructured a-C:H (Hydrogenated Amorphous Carbon) Thin Films by Gaseous Thermionic Vacuum Arc (G-TVA) Deposition Technique

机译:气态热电子真空电弧(G-TVA)沉积技术合成纳米结构的a-C:H(氢化非晶碳)薄膜

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摘要

The aim of this contribution is to present the properties of the nanostructured hydrogenated carbon thin films and to study their growth carried out in a special deposition technique based on Thermionic Vacuum Arc method. The Gaseous Thermionic Vacuum Arc (G-TVA) technology is an original deposition method performed in a special configuration, consisting of a heated thermionic cathode which provides an electron beam on the anode. The surface free energy was evaluated by contact angle and their optical properties were studied by Filmetrics F20 spectrometry system. Structure of the film has been investigated by Raman spectroscopy as well as the mechanical properties like hardness, wear resistance, film-substrate adhesion. The films showed two distinct Raman characteristic peaks located at 1,350 cm−1 (D-line) and 1,550 cm−1 (G-line), broad for Si and very sharp for glass substrates. The G-TVA enables to prepare soft (hardness ~6 GPa) or hard (~24 GPa) films.
机译:该贡献的目的是介绍纳米结构氢化碳薄膜的特性,并研究其在基于热电子真空电弧法的特殊沉积技术中进行的生长。气态热电子真空电弧(G-TVA)技术是一种以特殊配置执行的原始沉积方法,包括加热的热电子阴极,该阴极在阳极上提供电子束。通过接触角评估表面自由能,并通过Filmetrics F20光谱系统研究其光学性质。已经通过拉曼光谱法研究了膜的结构以及诸如硬度,耐磨性,膜-基底粘附性的机械性能。薄膜显示出两个不同的拉曼特征峰,分别位于1,350 cm-1(s-up)(D线)和1,550 cm-1(s-up)(G线),对于Si宽,对于玻璃基板非常尖。 G-TVA可以制备软(硬度约6 GPa)或硬(约24 GPa)膜。

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