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首页> 外文期刊>Physical review. B, Condensed Matter And Materals Physics >Temperature-dependent thermal conductivity and suppressed Lorenz number in ultrathin gold nanowires
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Temperature-dependent thermal conductivity and suppressed Lorenz number in ultrathin gold nanowires

机译:超薄金纳米线中温度依赖的导热率和抑制Lorenz数量

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The values of material parameters required for quantitative electrothermal modeling of nanoscale structures typically differ strongly from those of the bulk material. In this work, we apply a simple experimental technique that allows us to estimate values for thermal conductivity of both a metal nanowire and its insulating substrate by measuring the increase in resistance due to small amounts of dc self-heating. We measure gold nanowires with widths between 24 and 55 nm using this technique, and extract relevant material parameters as a function of temperature. Electrical resistivities of our nanowires are width dependent and much higher than bulk gold values, and enhanced temperature dependence of the resistivity indicates a depressed Debye temperature due to significant phonon softening. The fit thermal conductivity versus temperature of our 21-nm SiO2 on Si substrate is highly consistent with literature values for oxide thin films. We find the thermal conductivity of the nanowires increases rapidly with temperature and width and is well below the value for bulk gold, which can be qualitatively explained by the dominance of structural scattering. The Lorenz number is relatively constant over temperature, as in the Wiedemann-Franz theory, but it is significantly lower than reported values for bulk gold and exhibits some width dependence.
机译:纳米级结构的定量电热建模所需的材料参数的值通常与散装材料的电热量强烈不同。在这项工作中,我们应用一种简单的实验技术,使我们通过测量由于少量的直流自加热而通过测量电阻的增加来估计金属纳米线和绝缘基板的导热率的值。我们使用该技术测量具有24和55nm之间的宽度的金纳米线,并以温度的函数提取相关材料参数。我们的纳米线的电阻率为宽度,远高于散装金值,并且电阻率的增强温度依赖性表示由于显着的声子软化而抑制的德语温度。 Si衬底上的21nm SiO 2的拟合热导率与温度高度一致,与氧化物薄膜的文献值高。我们发现纳米线的导热率随温度和宽度迅速增加,远远低于散装金的值,这可以通过结构散射的优势来定制解释。 Lorenz数量在温度相对恒定,如在Wiedemann-Franz理论中,但它显着低于散装金的报告值,并呈现一些宽度依赖性。

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