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Terahertz Intersubband Absorption And Conduction Band Alignment In N-type Si/sige Multiple Quantum Wells

机译:N型Si / sige多量子阱中的太赫兹子带间吸收和导带对准

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Absorption due to conduction intersubband transitions is studied in n-type s-Si/SiGe multiquantum wells (MQW) of different well widths and barrier composition grown by UHV-chemical vapor deposition (CVD). The measured intersubband transition energies are compared with the theoretical results of a tight-binding model which provides the electronic band structure of the complete MQW system throughout the whole Brillouin zone. Our findings demonstrate both the high quality of the CVD grown MQWs and the effectiveness of the adopted tight-binding model in describing band profiles and electronic structures of SiGe multilayer systems. In particular we have evaluated the conduction band offsets in the investigated structures.
机译:在不同阱宽和通过特高压化学气相沉积(CVD)生长的势垒组成的n型s-Si / SiGe多量子阱(MQW)中研究了由于传导子带间跃迁引起的吸收。将测得的子带间跃迁能量与紧密结合模型的理论结果进行比较,该模型提供了整个布里渊区中完整的MQW系统的电子能带结构。我们的发现证明了CVD生长的MQW的高质量以及所采用的紧密结合模型在描述SiGe多层系统的能带分布和电子结构方面的有效性。特别是,我们已经评估了所研究结构中的导带偏移。

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