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Quasiparticle band offsets of semiconductor heterojunctions from a generalized marker method

机译:半导体异质结的准粒子能带偏移的广义标记方法

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摘要

We propose an approach to reliably calculate band offsets at heterointerfaces. It is based on standard density-functional theory, but overcomes the band-gap problem by including quasiparticle effects at the level of GW theory. Quasiparticle corrections are extracted from a heterojunction superlattice by translating the experimental concept of marker levels into a theoretical approach. The proposed scheme allows one to exploit the robust prediction of relative band positions within G W and therefore does not rely on the transferability of absolute G W corrections for the respective bulk materials. For zinc-blende GaN/AIN (001), we obtain a natural band offset of 0.55 eV, compared to 0.39 eV at the local-density approximation level.
机译:我们提出一种可靠地计算异质接口处的带偏移的方法。它基于标准的密度泛函理论,但是通过在GW理论的水平上包括准粒子效应,克服了带隙问题。通过将标记物水平的实验概念转化为理论方法,可以从异质结超晶格中提取准粒子校正。所提出的方案允许利用GW中相对带位置的鲁棒预测,因此不依赖于各个块状材料的绝对GW校正的可传递性。对于掺锌的GaN / AIN(001),我们获得了0.55 eV的自然带隙,而在局部密度近似水平下为0.39 eV。

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