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β-Si_3N_4(0001)/Si(111) interface: Phosphorus defects, valence band offsets, and their role of passivating the interface states

机译:β-Si_3N_4(0001)/ Si(111)界面:磷缺陷,价带偏移及其钝化界面状态的作用

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摘要

This work investigates the β-Si_3N_4(0001)/Si(111) interface based on a model with fully saturated interface bonds. The charge transfer at the interface and band alignment are calculated. The band alignment is corrected by GW_0 calculations. Furthermore, we investigate how substitutional phosphorus defects affect the electronic structure of the interface, in particular how they saturate the interface states and modify the valence band offsets.
机译:这项工作基于具有完全饱和界面键的模型研究β-Si_3N_4(0001)/ Si(111)界面。计算界面处的电荷转移和能带对准。通过GW_0计算来校正频带对准。此外,我们研究了磷的替代缺陷如何影响界面的电子结构,特别是它们如何使界面状态饱和并改变价带偏移。

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  • 来源
    《Physical review》 |2013年第16期|165310.1-165310.10|共10页
  • 作者单位

    SINTEF Materials and Chemistry, P.O. Box 124 Blindern, Forskningsveien 1, N-0314 Oslo, Norway;

    SINTEF Materials and Chemistry, P.O. Box 124 Blindern, Forskningsveien 1, N-0314 Oslo, Norway;

    Faculty of Physics and Center for Computational Materials Science, University of Vienna, Sensengasse 8/12, A-1090 Vienna, Austria;

    Faculty of Physics and Center for Computational Materials Science, University of Vienna, Sensengasse 8/12, A-1090 Vienna, Austria;

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