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Intrinsic spin Hall conductivity in three-dimensional topological insulatorormal insulator heterostructures

机译:三维拓扑绝缘体/正常绝缘体异质结构的本征自旋霍尔电导率

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摘要

Here we study how interface and edge perturbations as well as a size effect can be used to manipulate the transport properties in semiconductor heterostructures where a thin film of three-dimensional topological insulator (TI) is sandwiched by normal insulator (NI) slabs. Within the framework of the NI/TI/NI trilayer model based on a continual scheme, we argue that characteristics of electron states in the TI film (energy spectrum, envelope function profile, the Berry curvature, etc.) are controlled by the film thickness and TI/NI interface potential whose variation can lead to the modification of topological properties of the system. Calculating a spin Hall response for the NI/TI/NI trilayer infinite in the interface plane, we find that a series of quantum transitions between topological insulating phase and trivial band insulator phase can be induced by tuning both the film thickness and the interface potential. We draw in detail the corresponding phase diagram of the NI/TI/NT trilayer, which is controlled by change of the sign of either the hybridization gap or the dispersion parameter. To quantify the edge effect, we formulate a model of the half-infinite in the interface plane NI/TI/NI trilayer, which describes evanescent edge states and provides the necessary conditions under which they exist. It is found that the presence of the in-gap edge states is ambiguously determined by the phase of the TI film. Our findings provide a useful guide in choosing the relevant material parameters to facilitate the observation of quantum spin Hall effect in the TI/NI heterostructures.
机译:在这里,我们研究如何使用界面和边缘扰动以及尺寸效应来操纵半导体异质结构中的传输特性,在该结构中,三维拓扑绝缘体(TI)的薄膜被普通绝缘体(NI)板夹在中间。在基于连续方案的NI / TI / NI三层模型的框架内,我们认为TI膜中电子态的特征(能谱,包络函数分布,贝里曲率等)由膜厚控制TI / NI接口电位,其变化会导致系统拓扑特性的改变。通过计算界面平面中无限大的NI / TI / NI三层自旋霍尔响应,我们发现可以通过调整薄膜厚度和界面电势来诱发拓扑绝缘相和平带绝缘子相之间的一系列量子跃迁。我们详细绘制了NI / TI / NT三层的相应相图,该相图由杂交间隔或分散参数的符号变化控制。为了量化边缘效应,我们在界面平面NI / TI / NI三层中建立了一个半无限模型,该模型描述了e逝的边缘状态并提供了它们存在的必要条件。发现间隙内边缘状态的存在由TI膜的相位模糊地确定。我们的发现为选择相关的材料参数提供了有用的指导,以便于观察TI / NI异质结构中的量子自旋霍尔效应。

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  • 来源
    《Physical review. B, Condensed Matter And Materals Physics》 |2017年第7期|075302.1-075302.18|共18页
  • 作者单位

    Donostia International Physics Center (DIPC), P. de Manuel Lardizabal 4, 20018 San Sebastian, Basque Country, Spain,NRC Kurchatov Institute, Kurchatov Square 1, 123182 Moscow, Russia,Tomsk State University, 634050 Tomsk, Russia,Saint Petersburg State University, 198504 Saint Petersburg, Russia;

    Tomsk State University, 634050 Tomsk, Russia,Saint Petersburg State University, 198504 Saint Petersburg, Russia;

    Donostia International Physics Center (DIPC), P. de Manuel Lardizabal 4, 20018 San Sebastian, Basque Country, Spain,NRC Kurchatov Institute, Kurchatov Square 1, 123182 Moscow, Russia,Tomsk State University, 634050 Tomsk, Russia;

    Donostia International Physics Center (DIPC), P. de Manuel Lardizabal 4, 20018 San Sebastian, Basque Country, Spain,Saint Petersburg State University, 198504 Saint Petersburg, Russia,Departamento de Fisica de Materiales UPV/EHU, CFM-MPC UPV/EHU, 20080 San Sebastian/Donostia, Basque Country, Spain;

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