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A new method for luminescent porous silicon formation: reaction-induced vapor-phase stain etch

机译:发光多孔硅形成的新方法:反应诱导的气相污点蚀刻

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We report a new method to form reproducible luminescent porous silicon layers in p-type and n-type substrates of low and high resisivity, with minimum apparatus and maximum simplicity. No equipment, formation of electrical contacts, illumination or addition of surfactants is needed. The porous silicon layer is formed by exposing the Si surface to the vapor generated by a dissolution reaction of a metal or Si in a HF/HNO_3 mixture. The PL spectra of the layers have peaks located from 1.85 eV to 2.1 eV. The current-voltage characteristics of Al/PS/p-Si/Al devices formed on these layers are rectifying and follow an exponential dependence at low forward bias and a power law at high forward bias.
机译:我们报告了一种新方法,该方法可在低电阻率和高电阻率的p型和n型衬底中形成可再现的发光多孔硅层,并以最少的设备和最大的简化性。不需要设备,电接触的形成,照明或添加表面活性剂。通过使Si表面暴露于由金属或Si在HF / HNO_3混合物中的溶解反应所产生的蒸气来形成多孔硅层。层的PL光谱具有位于1.85 eV至2.1 eV的峰。在这些层上形成的Al / PS / p-Si / Al器件的电流-电压特性在进行整流,并遵循低正向偏置时的指数依赖性和高正向偏置时的功率定律。

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