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Sublimation growth of 2 inch diameter bulk AlN crystals

机译:2英寸直径AlN块状晶体的升华生长

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The technology of sublimation growth of 15 mm diameter bulk single AlN crystals is scaled to grow similar 2-inch diameter crystals. The best results are currently achieved with the two-stage technique including 1) seeding and initial growth of 2-3 mm thick single-crystal AlN layers on 2-inch diameter 6H-SiC wafers in pre-carbonized Ta crucibles in graphite equipment and 2) growth of bulk AlN crystals on the above AlN layers in tungsten crucibles and equipment. Therninitial AlN layers prove of good crystallographic quality but may contain up to 6 at.% of Si impurities. The eventual bulk AlN crystals consist of about 40 mm diameter round single-crystal core and polycrystalline rim. No impurities in concentration higher than 0.01 at.% are found in the bulk crystals. The bulk AlN crystal may be separated from the initial AlN layer to use the latter repeatedly for growth of a new crystal. Such "secondary" crystals were found to be semi-insulating.
机译:将直径15毫米的块状单AlN晶体升华生长的技术按比例缩放以生长类似的2英寸直径的晶体。目前,通过两阶段技术可获得最佳结果,其中包括:1)在石墨设备中预碳化Ta坩埚中的2英寸直径6H-SiC晶片上播种并初始生长2-3 mm厚的单晶AlN层,以及2 )在钨坩埚和设备的上述AlN层上生长块状AlN晶体。最初的AlN层证明了良好的晶体学质量,但可能包含高达6 at。%的Si杂质。最终的块状AlN晶体由直径约40 mm的圆形单晶核和多晶边缘组成。在大块晶体中没有发现浓度高于0.01原子%的杂质。可以将块状AlN晶体与初始AlN层分离,以将后者重复用于新晶体的生长。发现这种“次级”晶体是半绝缘的。

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