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Surface parametrization and curvature measurement of arbitrary 3-D objects: five practical methods

机译:任意3-D对象的表面参数化和曲率测量:五种实用方法

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摘要

Curvature sampling of arbitrary, fully described 3-D objects (e.g. tomographic medical images) is difficult because of surface patch parameterization problems. Five practical solutions are presented and characterized-the Sander-Zucker approach, two novel methods based on direct surface mapping, a piecewise linear manifold technique, and a turtle geometry method. One of the new methods, called the cross patch (CP) method, is shown to be very fast, robust in the presence of noise, and is always based on a proper surface parameterization, provided the perturbations of the surface over the patch neighborhood are isotropically distributed.
机译:由于表面斑块参数化问题,很难对任意完整描述的3D对象(例如断层摄影医学图像)进行曲率采样。提出并描述了五个实用的解决方案-Sander-Zucker方法,两种基于直接表面映射的新颖方法,分段线性流形技术以及乌龟几何方法。一种新的方法称为交叉斑块(CP)方法,显示出非常快,在有噪声的情况下具有鲁棒性,并且始终基于适当的表面参数化,前提是斑块附近的表面扰动为各向同性分布。

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