Measurement of parallelism of the surfaces of a transparent sample

J. C. Bhattacharya

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Measurement of parallelism of the surfaces of a transparent sample

机译：测量透明样品表面的平行度

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摘要

An interferometric method for the measurement of parallelism of the end faces of a transpar- ent material is described. It is based on the measurement of fringe displacement caused by the wedge angle of the material by using the Lau effect.

机译：描述了一种用于测量透明材料端面平行度的干涉测量方法。它基于使用Lau效应测量由材料的楔角引起的条纹位移。

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来源
《Optics and Lasers in Engineering》 |2001年第1期|p.27-31|共5页
作者
J. C. Bhattacharya;
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作者单位

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类光学;
关键词
Parallelism; Lau effect; Interferometry;

机译：并行性刘氏效应;干涉仪;

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Measurement of parallelism of the surfaces of a transparent sample

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