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Electrical and optical performance of midwave infrared InAsSb heterostructure detectors

机译:中波红外InAsSb异质结构探测器的电学和光学性能

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摘要

We investigate the high-operating temperature performance of InAsSb/AISb heterostructure detectors with cutoff wavelengths near 5 μm at 230 K. The devices have been fabricated with different types of absorbing layers: nominally undoped absorber (with n-type conductivity), and both n- and p-type doped. The results show that the device performance strongly depends on absorber layer type. Generally, the p-type absorber provides higher values of current responsivity than the n-type absorber, but at the same time also higher values of dark current. The device with the nominally undoped absorbing layer shows moderate values of both current responsivity and dark current. Resulting detectivities D* of nonimmersed devices vary from 2x10~9 to 5 × 10~9 cm Hz~(1/2) W~(-1) at 230 K, which is easily achievable with a two-stage thermoelectric cooler. Optical immersion increases the detectivity UP to 5 × 10~(10) Cm Hz~(1/2) W~(-1) .
机译:我们研究了在230 K下截止波长接近5μm的InAsSb / AISb异质结构检测器的高工作温度性能。该器件已制造成具有不同类型的吸收层:标称未掺杂的吸收体(具有n型导电性),并且两者-和p型掺杂。结果表明,器件性能在很大程度上取决于吸收层的类型。通常,p型吸收器比n型吸收器提供更高的电流响应值,但同时暗电流也更高。具有标称未掺杂吸收层的器件显示出适度的电流响应率和暗电流值。在230 K时,未浸入式设备的最终灵敏度D *从2x10〜9到5×10〜9 cm Hz〜(1/2)W〜(-1)不等,这可以通过两级热电冷却器轻松实现。光学浸没将检测率UP提高到5×10〜(10)Cm Hz〜(1/2)W〜(-1)。

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