...
机译:对以太赫兹频率工作的硅基块杂质带探测器的暗电流和光谱响应机制的分析
No. 50 Research Institute of China Electronics Technology Group Corporation, 318 Chang He Road, Shanghai 200331, China;
No. 50 Research Institute of China Electronics Technology Group Corporation, 318 Chang He Road, Shanghai 200331, China;
No. 50 Research Institute of China Electronics Technology Group Corporation, 318 Chang He Road, Shanghai 200331, China;
No. 50 Research Institute of China Electronics Technology Group Corporation, 318 Chang He Road, Shanghai 200331, China;
Laboratory of Advanced Material, Fudan University, Shanghai 200438, China;
No. 50 Research Institute of China Electronics Technology Group Corporation, 318 Chang He Road, Shanghai 200331, China;
Silicon; Blocked-impurity-band (BIB); Blocking layer; Absorbing layer; Dark current; Spectral response;
机译:基于InAs / GaSb超晶格的SiO2钝化光电二极管的暗电流机理和光谱响应
机译:长波长红外P-on-n HGCDTE检测器温度依赖性暗电流机制分析
机译:高温分离式红外探测器暗电流机理分析
机译:限制长波长红外体制的基于锑的超晶格红外探测器中的暗电流机制
机译:使用在饱和状态下运行的场效应晶体管进行太赫兹检测和成像。
机译:超导光子探测器中的三种温度机制:量子热和多相移作为暗计数的产生器
机译:高温下分离带红外探测器暗电流机理分析
机译:用于长波长多光谱成像的太赫兹探测器。