首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Proton induced K X-ray production cross sections of the elements Al, Si, Ti, Fe, and Ni in the 0.7-2.0 MeV energy range
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Proton induced K X-ray production cross sections of the elements Al, Si, Ti, Fe, and Ni in the 0.7-2.0 MeV energy range

机译:质子在0.7-2.0 MeV能量范围内诱导的Al,Si,Ti,Fe和Ni元素的K X射线产生截面

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摘要

Proton induced K-shell ionization cross sections were obtained for the elements Al, Si, Ti, Fe, and Ni in the 0.7-2.0 MeV energy range. The accuracy of these fundamental parameters is essential for PIXE analysis and the data in the literature present a considerable spread, mainly for Al and Si. The values obtained for Ti, Fe and Ni are compatible with the current theories and the experimental results reported in the literature. However, Al and Si cross sections present important differences from theoretical and experimental data. We propose values for the fluorescent yields of Al and Si that are compatible with recent results and can be incorporated in the computations of K X-ray production cross sections.
机译:在0.7-2.0 MeV的能量范围内,获得了质子诱导的K-壳电离横截面,用于元素Al,Si,Ti,Fe和Ni。这些基本参数的准确性对于PIXE分析至关重要,而文献中的数据也有相当大的分布,主要是Al和Si。 Ti,Fe和Ni的值与当前的理论和文献报道的实验结果兼容。但是,Al和Si横截面与理论和实验数据存在重要差异。我们提出了与最近的结果兼容的Al和Si荧光产量值,可以将其纳入K X射线产生截面的计算中。

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