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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Cross sections of X-ray production induced on Ti, Fe, Zn, Nb and Ta by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV
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Cross sections of X-ray production induced on Ti, Fe, Zn, Nb and Ta by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV

机译:O,Cl,Cu和Br离子在4 MeV和40 MeV之间的能量在Ti,Fe,Zn,Nb和Ta上诱导产生的X射线截面

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摘要

Differential cross section of X-ray production induced by 0, CI, Cu and Br ions with energies between 4 MeV and 40 MeV have been measured for thin targets of Ti, Fe, Zn, Nb and Ta in a direct way. A fully characterized silicon drift diode was used as X-rays detector. Beam currents have been measured by a system of two Faraday cups. Corrections for target thickness effects have been applied to the raw data. Experimental cross sections are compared both with theory and with previously published results. Experimental results from other authors are in reasonable agreement with ours over a wide energy range. Theory produces consistent results in the case of oxygen ions but gives cross sections even orders of magnitude below the experimental ones for heavier ions (ECPSSR-UA) or contrasting results (PWBA) depending on the ion-target combination.
机译:通过直接测量Ti,Fe,Zn,Nb和Ta的薄靶,已经测量了0,CI,Cu和Br离子在4 MeV和40 MeV之间的能量诱导的X射线产生的横截面。完全表征的硅漂移二极管用作X射线检测器。束电流已通过两个法拉第杯的系统进行了测量。对目标厚度影响的校正已应用于原始数据。将实验横截面与理论和先前发表的结果进行比较。其他作者的实验结果与我们在较宽的能量范围内的结果基本吻合。在氧离子的情况下,理论可以得出一致的结果,但是对于重离子(ECPSSR-UA)或对比结果(PWBA),取决于离子-靶标组合,其截面甚至比实验截面还要低几个数量级。

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