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Fast method for the estimation of the absorbed dose in X-ray microtomography

机译:快速估算X射线断层摄影术吸收剂量的方法

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摘要

Micro-CT imaging is an increasingly popular tool in the internal investigation of objects and materials. However, as an X-ray based technique, a potentially harmful radiation dose is deposited in the sample during the measurement. In (non small-animal) micro-CT imaging one is dealing with a strong variation in measurement systems and settings, resulting in many different acquisition circumstances and the absence of standard imaging protocols. Therefore, the deposited dose is rarely studied for micro-CT applications. This research aimed at developing a fast simulation technique to predict the dose associated with micro-CT scanning. Its performance is compared with that of two different Monte Carlo simulation tools and with a straight forward approach to estimate an upper limit for the dose. The fast simulation method, obtaining a dose estimation based on the energy absorption coefficient, is much faster than the Monte Carlo simulations, and the results are accurate within 30%. This enables us to predict the dose for a known sample and a known scanner setup, without complex Monte Carlo simulations and will allow researchers to avoid radiation damage or unwanted radiation induced effects, an increasingly important concern in 3D and 4D micro-CT scanning.
机译:Micro-CT成像是对象和材料内部调查中越来越受欢迎的工具。但是,作为基于X射线的技术,在测量过程中会在样品中沉积潜在有害的辐射剂量。在(非小动物)微型CT成像中,人们正在处理测量系统和设置的强烈变化,从而导致许多不同的采集环境以及缺乏标准成像协议。因此,对于微型CT应用,很少研究沉积剂量。这项研究旨在开发一种快速模拟技术,以预测与微CT扫描相关的剂量。将其性能与两种不同的蒙特卡洛模拟工具的性能进行比较,并采用直接方法估算剂量的上限。快速模拟方法基于能量吸收系数获得剂量估算值,其速度比蒙特卡洛模拟快得多,结果准确度在30%之内。这使我们能够预测已知样品和已知扫描仪设置的剂量,而无需复杂的蒙特卡洛模拟,并将使研究人员避免辐射损伤或有害的辐射诱发效应,这是3D和4D微型CT扫描中日益重要的问题。

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