首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Electrical tests and geometrical measurements on wafers and ladders of the GLAST tracker system
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Electrical tests and geometrical measurements on wafers and ladders of the GLAST tracker system

机译:GLAST跟踪器系统的晶片和梯子上的电气测试和几何测量

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The Large Area Telescope of the GLAST mission is a telescope for gamma rays in the range 10 MeV-300 GeV. It consists of a Silicon Strip Detectors' Tracker and a CsI e.m. calorimeter. The total surface of silicon detectors is almost 80 m~2, so it will have the largest equipped area among all space experiments. The Tracker consists of 9219 wafers, 8.9 cm x 8.9 cm cross-section and 400 μm thick. The strip pitch is 228 μm and each strip is 64 μm wide. Electrical and geometrical measurements are being performed on both wafers and ladders. The I-V and C-V characterization results on the first 2000 wafers and measurements of the geometric dimensions is presented; the ladders assembly procedures is described and workmanship tests by means of electrical and geometrical measurements is also shown.
机译:GLAST任务的大面积望远镜是用于处理10 MeV-300 GeV范围内的伽马射线的望远镜。它由一个硅带检测器的跟踪器和一个CsI e.m.量热仪。硅探测器的总面积接近80 m〜2,因此在所有空间实验中它将具有最大的装备面积。跟踪器由9219个晶片组成,截面为8.9 cm x 8.9 cm,厚度为400μm。条带间距为228μm,每个条带为64μm宽。正在对晶片和梯子进行电气和几何测量。前2000个晶片的I-V和C-V表征结果,以及几何尺寸的测量结果;描述了梯子的组装程序,并显示了通过电气和几何测量进行的工艺测试。

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