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Influence of substrates on roughness of self-supporting Ni films

机译:基材对自支撑镍膜粗糙度的影响

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Self-supporting Ni foils were obtained by floating of Ni films from water soluble substrates. Ni films were prepared by metal vapor vacuum arc (MEWA) ion deposition. The following release agents were applied on Si wafer substrates: betaine monohydrate with sucrose, potassium oleate, potassium oleate with sucrose. In addition polished NaCl crystals and self-supporting collodion foils were used as soluble substrates, respectively. Field emission scanning electron microscopy (FESEM) and atomic force microscope (AFM) were employed to analyze the surface morphology and the roughness of the Ni films and the substrates. The results indicate that the mean roughness of the self-supporting Ni foils depends on their substrates. Self-supporting collodion foils seem to be one of the most suitable candidates for preparing self-supporting Ni foils with low roughness. Mean roughness of the best self-supporting Ni foils is about 3.8 nm.
机译:自支撑镍箔是通过从水溶性基材上浮起镍膜而获得的。通过金属蒸气真空电弧(MEWA)离子沉积制备Ni膜。将以下脱模剂施用于Si晶片基材上:甜菜碱一水合物与蔗糖,油酸钾,油酸钾与蔗糖。此外,抛光的NaCl晶体和自支撑胶棉箔分别用作可溶基质。利用场发射扫描电子显微镜(FESEM)和原子力显微镜(AFM)分析了镍膜和基体的表面形貌和粗糙度。结果表明,自支撑镍箔的平均粗糙度取决于其基材。自支撑胶棉箔似乎是制备低粗糙度自支撑镍箔的最合适的候选材料之一。最好的自支撑镍箔的平均粗糙度约为3.8 nm。

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