Biparametric correction methods using two shapers for In/CdTe/Pt radiation detector

摘要

Biparametric correction methods have reportedly been used to improve the energy resolutions of CdTe or CdZnTe radiation detectors. There are two methods for the correction. One is a method that uses the rise time and pulse height, and the other is a method that uses two pulse heights acquired from a fast and a slow shaper. The latter one for a 2.3-mm-thick In/CdTe/Pt radiation detector was investigated for this paper. The polarization effect resulting in short-term instability in the energy spectrum should be resolved before an In/CdTe/Pt detector is used. A pulsed bias voltage shutdown technique was used with the two shaper biparametric correction method to overcome both the polarization effect and the incomplete carrier collection. An energy resolution of 4.6% for a 122 keV peak was observed for a 2.3-mm-thick In/CdTe/Pt detector at 35 ℃ for 2 h after applying a bias voltage of - 800 V. Furthermore, the energy resolutions are improved for all the photo peaks when a constant correction factor is applied to the five photo peaks in the energy range 59.5-1333 keV.