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Time walk correction of CdTe detectors using depth sensing technique

机译:使用深度感测技术的CdTe检测器的时程校正

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A digital timing method aiming to minimize the time walk caused by the depth-dependent pulse shape variations in CdTe detectors has been developed. Detector pulses are digitized at the preamplifier stage and a full digital process is carried out to deduce and correct the time walk according to the interaction depth. A time resolution of 6.52 ns FWHM at an energy threshold of 150 keV with a CdTe detector (10×10×1 mm~3) is achieved, which is close to the intrinsic resolution of the detector. The method improves the time resolution with no loss of detection efficiency and it is easy to implement. It is confirmed that the slow mobility and the short lifetime of the holes are major obstacles for further improvement in the timing performance of the CdTe detectors. The method is applicable to any semiconductor detector.
机译:已经开发了一种数字定时方法,旨在最小化CdTe检测器中与深度有关的脉冲形状变化所引起的时间步移。在前置放大器级将检测器脉冲数字化,并根据相互作用深度执行全数字过程来推导和校正时间步长。使用CdTe检测器(10×10×1 mm〜3)在150 keV的能量阈值下获得的时间分辨率为6.52 ns FWHM,接近于检测器的固有分辨率。该方法在不降低检测效率的情况下提高了时间分辨率,并且易于实现。可以确定的是,空穴的慢迁移率和短寿命是进一步改善CdTe检测器定时性能的主要障碍。该方法适用于任何半导体检测器。

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