机译:质子和中子辐照诱导的CCD检测器的电荷转移效率增加
State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect Northwest Institute of Nuclear Technology Xian 710024 China;
State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect Northwest Institute of Nuclear Technology Xian 710024 China;
School of Materials Science and Engineering Xiangtan University Xiangtan 411105 China;
School of Materials Science and Engineering Xiangtan University Xiangtan 411105 China;
School of Materials Science and Engineering Xiangtan University Xiangtan 411105 China;
Research Institute of Xian High Technology Xian 710024 China;
State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect Northwest Institute of Nuclear Technology Xian 710024 China;
School of Materials Science and Engineering Xiangtan University Xiangtan 411105 China;
CCD; Charge transfer inefficiency; Displacement damage; Proton radiation; Neutron radiation;
机译:扫描前和扫描后扫描电荷器件CCD236中的电荷转移效率低下
机译:退火界限可防止Chandra X射线CCD的电荷转移效率进一步降低
机译:在不同积分时间下PPD CIS中质子辐照引起的电荷转移效率低下的测量和研究
机译:在欧几里得暗能量任务的CCD273检测器中评估质子辐射引起的电荷转移效率低下
机译:对用作太空应用的核带电粒子检测器的电荷耦合器件(CCD)的评估。
机译:能量为1 keV至10 MeV的中子辐照从聚乙烯转化器出来的质子的特性
机译:评估欧几里德暗能量任务CCD273探测器中质子辐射诱导的电荷转移效率低下