Applications of principal component analysis for energy reconstruction in position-sensitive semiconductor detectors

摘要

Semiconductor detectors with pixelated anodes offer a desirable combination of position sensitivity and energy resolution that are suitable for numerous applications in gamma-ray detection and imaging. Pixelization of electrodes also entails a non-uniform amplitude response as a function of gamma-ray interaction position. Energy calibrations as a function of interaction position improve energy resolution, but systematic errors in the energy reconstruction process persist and limit energy resolution at fixed electronic noise. Digitization of signals induced on collecting and adjacent electrodes offers rich information about gamma-ray interactions and their charge drift and collection as a function of time. Despite the abundance of signals for each interaction, human intuition and rule-based approaches fail to utilize the entire set of observed signals to mitigate the sources of systematic error. In order to maximize the utility of digitized signals and improve energy resolution, principal component analysis is applied towards digitized signals observed in semiconductor detectors with pixelated anodes. Principal components identified in the process form the basis for position-specific energy corrections. By leveraging this additional information encoded within digitized signals, energy resolution improves by factors between 10 and 15% with respect to full-width at half and tenth maximum values. The feature that accounts for the maximum amount of explained variance between interactions in any given pixel correlates strongly with the depth of interaction.