Abstract'/> Energy resolution improvement of CdTe detectors by using the principal component analysis technique
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Energy resolution improvement of CdTe detectors by using the principal component analysis technique

机译:利用主成分分析技术提高CdTe探测器的能量分辨率

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AbstractIn this paper, we report on the application of the Principal Component Analysis (PCA) technique for the improvement of theγ-ray energy resolution of CdTe detectors. The PCA technique is used to estimate the amount of charge-trapping effect which is reflected in the shape of each detector pulse, thereby correcting for the charge-trapping effect. The details of the method are described and the results obtained with a CdTe detector are shown. We have achieved an energy resolution of 1.8 % (FWHM) at 662 keV with full detection efficiency from a 1 mm thick CdTe detector which gives an energy resolution of 4.5 % (FWHM) by using the standard pulse processing method.HighlightsThe Principle Component Analysis technique is applied to sampled pulses from a CdTe detector.A strong correlation between the charge-trapping effect and the first principal component is demonstrated.An energy resolution of 1.8% at 662 keV is achieved with a 1 mm thick CdTe detector.
机译: 摘要 在本文中,我们报告了主成分分析(PCA)技术在改进 γ -射线能量分辨率。 PCA技术用于估计在每个检测器脉冲的形状中反映的电荷俘获效应的量,从而校正电荷俘获效应。描述了该方法的细节,并显示了使用CdTe检测器获得的结果。我们已经通过使用标准脉冲处理方法从1 mm厚的CdTe检测器获得了662 keV时1.8%(FWHM)的能量分辨率和完整的检测效率。 突出显示 主成分分析技术适用于CdTe检测器的采样脉冲。 证明了电荷俘获效应与第一个主成分之间有很强的相关性。 使用1 mm厚的CdTe检测器,在662 keV时的能量分辨率为1.8%。< / ce:para>

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