...
首页> 外文期刊>Multimedia Tools and Applications >Nondestructive prediction model of internal hardness attribute of fig fruit using NIR spectroscopy and RF
【24h】

Nondestructive prediction model of internal hardness attribute of fig fruit using NIR spectroscopy and RF

机译:使用NIR光谱和RF的无图果实内部硬度属性的无损预测模型

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Hardness is one of the most important quality characteristics, which has an important influence on the processing and product quality of figs. A rapid non-destructive detection method for the hardness of figs was proposed based on visible/near infrared (VIS/NIR) spectroscopy technology. This study attempts to optimize the construction of a fig hardness model and predict the accuracy of thereof. An NIR spectrometer was used to collect the diffuse reflectance spectrum data in the wavelength range of 950-1700 nm, while the hardness index was measured using texture analyzer. Random forest (RF) and partial least square (PLS) methods were used to model the spectral data and hardness, respectively, and a better algorithm for the model construction was obtained. The RF model performed better in the characteristic band (1150.83-1232.43 nm), with correlation coefficient (R-2), root mean square error of calibration (RMSEC), and root mean square error of prediction (RMSEP) of 0.76, 67.61, and 83.94 respectively. The PLS model worked well at the full band (R-2 = 0.77, RMSEC = 59.20, RMSEP = 91.84). However, the prediction time of the PLS was slightly shorter than that of RF model (0.0004 s 0.0098 s). The results show that it is feasible to detect the hardness of figs without destroying them by using VIS/NIR diffuse reflectance spectroscopy combined with sample set partitioning based on joint x-y distances (SPXY), RF, and PLS algorithms. This study provides new technical means for fig products enterprises to determine the hardness of figs in the early stages of production rapidly and evaluate the processing quality of fig products, which has a high practical application potential.
机译:硬度是最重要的质量特征之一,对图1和图2的加工和产品质量具有重要影响。基于可见/近红外(VI / NIR)光谱技术提出了一种快速的无损检测方法。该研究试图优化实验性模型的结构并预测其准确性。使用NIR光谱仪用于在950-1700nm的波长范围内收集漫反射谱数据,而使用纹理分析仪测量硬度指数。随机森林(RF)和部分最小二乘(PLS)方法分别用于模拟光谱数据和硬度,获得更好的模型结构算法。 RF模型在特征频带(1150.83-1232.43nm)中更好地执行,具有相关系数(R-2),校准的根均方误差(RMSEC),以及预测(RMSEP)的根均线误差为0.76,67.61,分别为83.94。 PLS模型在全带(R-2 = 0.77,RMSEC = 59.20,RMSEP = 91.84)工作良好。然而,PL的预测时间略短于RF模型(0.0004 s <0.0098秒)。结果表明,在不使用基于接合X-Y距离(SPXY),RF和PLS算法的样品设定分配的情况下,可以通过使用VI / NIR漫射反射光谱来破坏图1和图4的硬度来检测图1的硬度是可行的。本研究提供了无花果企业的新技术手段,以快速地确定生产早期阶段的硬度,并评估无花果产品的加工质量,具有很高的实际应用潜力。

著录项

  • 来源
    《Multimedia Tools and Applications》 |2021年第14期|21579-21594|共16页
  • 作者

    Sun Rui; Zhou Jing-yu; Yu Duo;

  • 作者单位

    Qilu Univ Technol Sch Food Sci & Engn Shandong Acad Sci Jinan 250353 Shandong Peoples R China;

    Qilu Univ Technol Sch Food Sci & Engn Shandong Acad Sci Jinan 250353 Shandong Peoples R China;

    Qilu Univ Technol Sch Math & Stat Shandong Acad Sci Jinan 250353 Shandong Peoples R China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Hardness; NIR spectroscopy; Fig; RF; PLS;

    机译:硬度;NIR光谱学;无花果;rf;pls;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号