首页> 外文期刊>Microelectronics & Reliability >Numerical modeling of warpage induced in QFN array molding process
【24h】

Numerical modeling of warpage induced in QFN array molding process

机译:QFN阵列成型过程中翘曲的数值模拟

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Warpage is a critical issue for QFN array molding process. In this paper, a cure-dependent viscoelastic constitutive model is established to model the cure-induced warpage in array molding process. For the relaxation modulus functions of the packaging polymer, the equilibrium moduli are modeled with a model based on scaling analysis and the relaxation behavior of the transient part is described by the cure-dependent relaxation amplitude and reduced relaxation times which are based on the time-conversion superposition principle. The cure-dependent parameters are characterized by using an integrated approach of dynamical mechanical analysis (DMA) and differential scanning calorimetry (DSC) measurements. Finite element modeling is carried out for three configurations of a carrier package map mould and the warpage induced during the curing process and cooling down is predicted. The results show that warpage induced during the curing process has significant contribution on the total warpage of the map.
机译:翘曲是QFN阵列成型工艺的关键问题。本文建立了依赖于固化的粘弹性本构模型,以模拟阵列成型过程中固化引起的翘曲。对于包装聚合物的弛豫模量函数,使用基于比例分析的模型对平衡模量进行建模,并通过依赖于固化的弛豫幅度和减少的弛豫时间(基于时间-转换叠加原理。通过使用动态力学分析(DMA)和差示扫描量热法(DSC)测量的集成方法来表征取决于固化的参数。对载体包装图模具的三种配置进行了有限元建模,并预测了固化过程和冷却过程中引起的翘曲。结果表明,固化过程中引起的翘曲对地图的总翘曲有重要贡献。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号