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Preparation of multi-tip arrays on flexible substrates for large-scale microfabrication

机译:在用于大型微加工的柔性基板上制备多尖端阵列

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摘要

Scanning probe microscopy (SPM) provides an important way for microanofabrication. Compared with single-tip mode, parallel multi-tip mode enables an effective way for microfabrication with large scale and high efficiency by SPM. During the preparation of multi-tip array, the height difference between different tips is quite difficult to be eliminated. In the present work multi-tip arrays were prepared on different flexible rubber substrates with good bonding strength. Finite element analysis was carried out based on a hyperelastic constitutive model for selecting a suitable rubber substrate for producing the multi-tip array, and the initial shear modulus C10 should be from 0.5 to 17. A series of comparative fabrication experiments were conducted by different multi-tip arrays. The multi-tip array with flexible substrates fulfilling the prediction model can compensate obviously the height difference resulting from microsphere size, and the flexible substrate with a lower C10 in this range is better for the scratching fabrication. Using the multi-tip array, large-scale surface patterning can be fabricated with low cost and easy operation. This work can promote the wide application of SPM and development of the surface texture engineering.
机译:扫描探针显微镜(SPM)为显微/纳米加工提供了重要的途径。与单针尖模式相比,并行多针尖模式为通过SPM进行大规模,高效率的微细加工提供了有效的途径。在准备多尖端阵列时,很难消除不同尖端之间的高度差。在本工作中,在具有良好粘结强度的不同柔性橡胶基材上制备了多尖端阵列。基于超弹性本构模型进行有限元分析,以选择合适的橡胶基材以生产多尖端阵列,初始剪切模量C10应为0.5到17。 -tip数组。满足预测模型要求的具有柔性基板的多尖端阵列可以明显补偿由于微球尺寸引起的高度差,并且在此范围内具有较低C10的柔性基板更适合于划痕制造。使用多尖端阵列,可以低成本且易于操作来制造大规模的表面图案。这项工作可以促进SPM的广泛应用和表面纹理工程的发展。

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