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Measurement point selection and modal damping identification for bladed disks

机译:叶片盘的测量点选择和模态阻尼识别

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摘要

A novel measurement point selection (MPS) technique for bladed disks and integrally bladed disks (blisks) is presented and applied to a new modal damping identification method. When gathering data to be used for applications such as damping identification in blisks, it is important to measure points which provide sufficient and accurate information for the analysis. However, to reduce the experimental time and cost, the measurement points should be chosen optimally so that the minimum number of measurements have to be collected. This paper discusses a modified form of the effective independence distribution vector (EIDV) method presented by Penny et al. and adapted by Holland et al. The key aspect of the proposed method is that it uses only single sector-level calculations instead of the full system. A residual weighting optimizes the MPS technique by ranking individual measurement locations according to their noise sensitivity. The method presented provides results equivalent to the full-system EIDV method, but it decreases the computational cost, increases the robustness of the identification, and minimizes the measurement time. Also, a novel method to identify a damping parameter for each mode in a frequency range of interest is presented. This method utilizes the proposed MPS technique to increase the accuracy of the identification. Measurement locations and modal damping results for a 30 degree of freedom system and a blisk with a more complex geometry are presented. Using the proposed methodologies it is possible to obtain an accurate modal damping identification with a decreased computational and measurement cost.
机译:提出了一种用于叶片盘和整体叶片盘(叶盘)的新型测量点选择(MPS)技术,并将其应用于一种新的模态阻尼识别方法。当收集数据以用于应用中(例如,在叶盘中进行阻尼识别)时,重要的是要测量能为分析提供足够且准确的信息的点。但是,为了减少实验时间和成本,应该最佳地选择测量点,以便必须收集最少的测量次数。本文讨论了Penny等人提出的有效独立分布矢量(EIDV)方法的一种修改形式。并由Holland等修改。所提出方法的关键方面是它仅使用单个扇区级别的计算,而不是整个系统。残差加权通过根据各个测量位置的噪声敏感度对MPS技术进行优化。提出的方法可提供与整个系统EIDV方法等效的结果,但它降低了计算成本,提高了识别的鲁棒性,并最大程度地缩短了测量时间。而且,提出了一种新颖的方法,该方法为感兴趣的频率范围内的每个模式识别阻尼参数。该方法利用提出的MPS技术来提高识别的准确性。给出了30自由度系统和具有更复杂几何形状的叶盘的测量位置和模态阻尼结果。使用所提出的方法,可以以减少的计算和测量成本获得准确的模态阻尼识别。

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