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Complex-Coefficient Frequency Domain Stability Analysis Method for a Class of Cross-Coupled Antisymmetrical Systems and Its Extension in MSR Systems

机译:一类交叉耦合反对称系统的复系数频域稳定性分析方法及其在MSR系统中的扩展

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摘要

This paper develops a complex-coefficient frequency domain stability analysis method for a class of cross-coupled two-dimensional antisymmetrical systems, which can greatly simplify the stability analysis of the multiple-input multiple-output (MIMO) system. Through variable reconstruction, the multiple-input multiple-output (MIMO) system is converted into a single-input single-output (SISO) system with complex coefficients. The pole locations law of the closed-loop system after the variable reconstruction has been revealed, and the controllability as well as observability of the controlled plants before and after the variable reconstruction has been studied too, and then the classical Nyquist stability criterion is extended to the complex-coefficient frequency domain. Combined with the rigid magnetically suspended rotor (MSR) system with heavy gyroscopic effects, corresponding stability criterion has been further developed. Compared with the existing methods, the developed criterion for the rigid MSR system not only accurately predicts the absolute stability of the different whirling modes, but also directly demonstrates their relative stability, which greatly simplifies the analysis, design, and debugging of the control system.
机译:本文针对一类交叉耦合的二维反对称系统,开发了一种复系数频域稳定性分析方法,可以大大简化多输入多输出(MIMO)系统的稳定性分析。通过变量重构,将多输入多输出(MIMO)系统转换为具有复杂系数的单输入单输出(SISO)系统。揭示了变量重构后闭环系统的极点位置定律,并研究了变量重构前后受控植物的可控性和可观性,然后将经典的奈奎斯特稳定性判据扩展为复数系数频域。结合具有强烈陀螺效应的刚性磁悬浮转子(MSR)系统,进一步开发了相应的稳定性标准。与现有方法相比,所开发的刚性MSR系统判据不仅可以准确地预测不同回旋模式的绝对稳定性,而且可以直接证明其相对稳定性,从而大大简化了控制系统的分析,设计和调试。

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  • 来源
    《Mathematical Problems in Engineering》 |2014年第3期|765858.1-765858.11|共11页
  • 作者

    Yuan Ren; Jiancheng Fang;

  • 作者单位

    Department of Space Equipment, Equipment Academy, Beijing 101416, China,School of Instrumentation Science & Opto-electronics Engineering, Beihang University, Beijing 100191, China;

    School of Instrumentation Science & Opto-electronics Engineering, Beihang University, Beijing 100191, China;

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