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The Effect of Process Parameters on 4H-SiC Single Crystal Grown by a PVT Method

机译:工艺参数对PVT法生长4H-SiC单晶的影响

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摘要

Extensive study of various process parameters to influence on the growth of 4H-SiC crystal has been carried out using the transformation of the 6H-SiC seed by a PVT method. The axial temperature gradients were increased throughout increasing the crucible length along growth direction in order to enhance the growth rate and transformed crystal yield. The N_2/Ar gas ratio used during the crystal growth related with carrier concentration/mobility of grown crystal. In the initial stage of growth, foreign polytypes such as 6H/15R were observed on 6H-SiC seed crystal but 4H crystals were entirely grown after the process optimization. While the typical absorption spectrum of SiC seed crystal indicated that the SiC polytype was the 6H-SiC with fundamental absorption energy of about 3.02eV, absorption spectrum of grown SiC crystal exhibited 4H-SiC with fundamental absorption energy of about 3.26eV. The entirely transformed SiC region exhibited lower micropipe density than 6H/4H transition region.
机译:利用PVT法转化6H-SiC晶种,已经对影响4H-SiC晶体生长的各种工艺参数进行了广泛的研究。沿整个生长方向增加坩埚长度时,轴向温度梯度会增加,以提高生长速率和转化的晶体产率。晶体生长过程中使用的N_2 / Ar气体比率与晶体生长的载流子浓度/迁移率有关。在生长的初始阶段,在6H-SiC晶种上观察到外来多态性,例如6H / 15R,但经过工艺优化后,4H晶体完全生长。 SiC晶种的典型吸收光谱表明SiC多晶型为6H-SiC,基本吸收能约为3.02eV,而生长的SiC晶体的吸收谱显示4H-SiC,基本吸收能约为3.26eV。与6H / 4H过渡区相比,完全转变的SiC区显示出较低的微管密度。

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  • 来源
    《Materials science forum》 |2011年第2011期|p.40-43|共4页
  • 作者单位

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Electronic Ceramics Center (ECC), Department of Nano Technology, Dong-Eui University, 995 Eomgwangno, Busanjin-gu, Busan, 614-714, Korea;

    Research Institute of Industrial Science and Technology, Pohang, Kyungbuk, 790-600, Korea;

    Research Institute of Industrial Science and Technology, Pohang, Kyungbuk, 790-600, Korea;

    Research Institute of Industrial Science and Technology, Pohang, Kyungbuk, 790-600, Korea;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    sublimation; transformation; temperature gradient; doping levels; hall measurements;

    机译:升华;转型;温度梯度掺杂水平;霍尔测量;

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