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Ni-Cu interdiffusion and its implication for ageing in Ni-coated Cu conductors

机译:镀镍铜导体中镍铜互扩散及其对老化的影响

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After heat treatment at 400 ℃ the effective resistivities of typical Ni-coated Cu conductor wires increased by up to 6.9% as a result of Ni-Cu interdiffusion. Direct Ni-Cu interdiffusion experiments were performed between metal foils at temperatures of 400-600℃ for times up to 192 h. Calculated activation energies were in range 80-90 kJ mol~(-1), consistent with a grain boundary diffusion mechanism. Analysis of published Ni-Cu interdiffusion coefficients suggested a clear dependence on grain size and grain shape. A concentric circle model was developed to simulate changes in composition and effective resistivity in the Ni-Cu wires as a function of time. It was predicted that it would take 1.4 × 10~5 h at 400 ℃ for 10% increase in the effective resistivity of an AWG18-Class27 conductor wire. Good agreement between simulated and experimental data for effective resistivity was only achieved by employing effective diffusion coefficients corrected for microstructural effects.
机译:经过400℃的热处理,由于镍铜相互扩散,典型的镀镍铜导体线的有效电阻率提高了6.9%。在金属箔之间在400-600℃的温度下进行直接Ni-Cu互扩散实验,时间长达192 h。计算出的活化能在80-90 kJ mol〜(-1)范围内,与晶界扩散机理一致。对已发表的Ni-Cu互扩散系数的分析表明,其对晶粒尺寸和晶粒形状的依赖性明显。开发了一个同心圆模型来模拟Ni-Cu导线中成分和有效电阻率随时间的变化。据预测,将AWG18-Class27导线的有效电阻率提高10%,将在400℃下花费1.4×10〜5 h。仅通过采用针对微结构效应校正的有效扩散系数,才能在模拟数据和实验数据之间取得有效电阻率的良好一致性。

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