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首页> 外文期刊>Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing >The electronic structure and spectroscopic properties of 3C, 2H, 4H, 6H, 15R and 21R polymorphs of SiC
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The electronic structure and spectroscopic properties of 3C, 2H, 4H, 6H, 15R and 21R polymorphs of SiC

机译:SiC的3C,2H,4H,6H,15R和21R多晶型物的电子结构和光谱性质

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摘要

The electronic structure, bonding, and optical properties of six polymorphs of SiC: 3C, 2H, 4H, 6H, 15R, and 21R were studied by the density functional-based first-principles OLCAO method. The results were compared with other existing calculations as well as experimental data. It is shown that the different stacking sequences of the Si-C bi-layers in these polymorphs result in minute but recognizable differences in the partial density of states, Mulliken effective charges, and bond order values, indicating the importance of the intermediate range ordering in these crystals. The optical properties calculation for these polymorphs also shows some marked differences among them and can be explained, at least partially, by the LDA-based electronic band structures. Also presented is the calculated X-ray absorption near edge spectroscopy (XANES) of the Si-K, Si-L_3 and N-K edges in 3C-SiC.
机译:通过基于密度泛函的第一性原理OLCAO方法研究了SiC的6种多晶型物3C,2H,4H,6H,15R和21R的电子结构,键合和光学性质。将结果与其他现有计算以及实验数据进行了比较。结果表明,在这些多晶型物中,Si-C双层的不同堆积顺序导致状态的局部密度,Mulliken有效电荷和键序值的微小但可识别的差异,这表明中间范围有序的重要性这些晶体。这些多晶型物的光学性质计算也显示出它们之间的一些明显差异,并且可以至少部分地通过基于LDA的电子能带结构来解释。还介绍了3C-SiC中Si-K,Si-L_3和N-K边缘的X射线吸收近边缘光谱(XANES)。

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