Ion-induced secondary electrons emission measurement from MgO films deposited on multiwalled carbon nanotubes

摘要

This study reports on the ion-induced secondary electrons emission (SEE) from MgO films deposited on multiwalled carbon nanotubes (MWCNTs). MWCNTs are grown on quartz substrates using plasma enhanced chemical vapor deposition system and MgO films are deposited on that MWCNTs using electron-beam evaporation technique. The SEE coefficients are obtained from experimentally measured firing voltage. We observed stabilized and lower firing voltage of MgO films deposited on MWCNTs than that for MgO. The experimental results suggest that the density, uniformity and alignment of nanotubes influence the local electric field in nano-pores of MgO films which in turn affects the emission of secondary electrons from MgO surface.