首页> 外文期刊>Key Engineering Materials >Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy
【24h】

Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy

机译:成分组成梯度的外延钛酸锶锶钡薄膜的制备及表征

获取原文
获取原文并翻译 | 示例
       

摘要

Epitaxially graded barium strontium titanate (Ba_xSr_(1-x))TiO_3 (x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La_(0.7)Sr_(0.3))MnO_3 (LSMO)/LaAlO_3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140℃. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.
机译:外延梯度钛酸锶钡(Ba_xSr_(1-x))TiO_3(x = 0.75,0.8,0.9,1.0,分别缩写为BST75,BST80,BST90和BTO)薄膜在(La_( 0.7)Sr_(0.3))MnO_3(LSMO)/ LaAlO_3(LAO)单晶衬底。使用接触模式的扫描探针显微镜来表征从室温到140℃的极化温度依赖性。结果表明,BST梯度薄膜的压电响应信号随温度变化明显,梯度结构的介电常数对温度的依赖性较平坦。此外,对于BST 75,BST 80和BST90的铁电-顺电(F-P)相变温度,SPM图像的对比度较低,但对于BTO的F-P转变温度,SPM图像的对比度较低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号