首页> 外文期刊>Journal of materials science >Interfacial reactions and mechanical properties of Sn-3.0Ag-0.5Cu solder with pure Pd or Pd(P) layers containing thin-Au/Pd/Ni(P) surface-finished PCBs during aging
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Interfacial reactions and mechanical properties of Sn-3.0Ag-0.5Cu solder with pure Pd or Pd(P) layers containing thin-Au/Pd/Ni(P) surface-finished PCBs during aging

机译:Sn-3.0Ag-0.5Cu焊料在纯Pd或Pd(P)层中包含表面处理过的Au / Pd / Ni(P)薄表面PCB的界面反应和机械性能

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摘要

The microelectronics packaging industry, although rapidly growing, faces several challenges including 3-D integration, issues with multifunctional capability, and fluctuating input/output (I/O) density, among others. Better-performing microelectronics assemblies for mitigating these challenges require alloys with superior solderability and minimal metallization layer thickness. To this end, in this study, we investigated two kinds of electroless-nickel electroless-palladium immersion gold (ENEPIG) with 0.3 urn Ni, 0.1 μm pure Pd or Pd-phosphorous (Pd(P)), and 0.1 μm Au layers plated on a printed circuit board (PCB) substrate. To analyze the effects of the pure Pd and Pd(P) layers in the thin ENEPIG, we evaluated the interfacial reactions and mechanical properties of the SAC305 solder with a pure Pd or Pd(P) layer in the thin ENEPIG joints after aging at 150 ℃. Needle-type and chunky-type (Cu,Ni)_6Sn_5 IMCs were formed at the interfaces of the pure Pd and Pd(P) joints, respectively. The (Cu,Ni)_6Sn_5 IMC of the pure Pd joint was thinner than that of the Pd(P) joint after reflowing and aging for 100 h. However, the total IMC of the Pd(P) joint was thinner than that of the pure Pd joint from 250 to 1000 h. In a low-speed shear test, the shear strength of the Pd(P) joint was higher than that of the pure Pd joint for the entire aging time. Most fractures occurred at the Sn-rich surface with a ductile mode, regardless of the different substrates and aging times. After high-speed shear testing, the shear strength of the pure Pd joint was higher than that of the Pd(P) joint until aging for 100 h. After aging for 250 h, the shear strength of the Pd(P) joint was higher than that of the pure Pd joint. The results for brittle fracture rate were similar to those for high-speed shear strength. Hence, Pd(P) joints are expected to demonstrate higher reliabilities than pure Pd joints after long aging treatment.
机译:微电子封装行业尽管发展迅速,但仍面临数个挑战,包括3-D集成,多功能功能问题以及输入/输出(I / O)密度波动等。为了缓解这些挑战,性能更好的微电子组件需要合金具有出色的可焊性和最小的金属化层厚度。为此,在这项研究中,我们研究了两种化学镍-化学镀钯金(ENEPIG),它们具有0.3 Ni Ni,0.1μm纯Pd或Pd-磷(Pd(P))和0.1μm镀金在印刷电路板(PCB)基板上。为了分析薄ENEPIG中纯Pd和Pd(P)层的影响,我们评估了150℃时效后薄ENEPIG接头中带有纯Pd或Pd(P)层的SAC305焊料的界面反应和机械性能。 ℃。分别在纯Pd和Pd(P)接头的界面处形成了针型(Cu,Ni)_6Sn_5 IMC。回流和时效100小时后,纯Pd接头的(Cu,Ni)_6Sn_5 IMC比Pd(P)接头薄。然而,在250至1000小时内,Pd(P)接头的总IMC比纯Pd接头的总IMC薄。在低速剪切试验中,在整个时效过程中,Pd(P)接头的剪切强度高于纯Pd接头的剪切强度。无论基体和老化时间如何,大多数断裂都以富韧性模式发生在富锡表面。高速剪切试验后,直到时效100 h,纯Pd接头的剪切强度都高于Pd(P)接头的剪切强度。老化250小时后,Pd(P)接头的剪切强度高于纯Pd接头的剪切强度。脆性断裂率的结果与高速剪切强度的结果相似。因此,经过长期时效处理后,预计Pd(P)接头比纯Pd接头具有更高的可靠性。

著录项

  • 来源
    《Journal of materials science》 |2020年第5期|4027-4039|共13页
  • 作者单位

    Welding and Joining R&D Group Korea Institute of Industrial Technology (KITECH) 156 Gaetbeol-ro Yeonsu-gu Incheon 21999 Korea School of Advanced Materials Science & Engineering Sungkyunkwan University 2066 Seobu-ro Jangan-gu Suwon 16419 Gyeonggi-do Korea;

    Welding and Joining R&D Group Korea Institute of Industrial Technology (KITECH) 156 Gaetbeol-ro Yeonsu-gu Incheon 21999 Korea;

    School of Advanced Materials Science & Engineering Sungkyunkwan University 2066 Seobu-ro Jangan-gu Suwon 16419 Gyeonggi-do Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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