Ensuring a High Quality Digital Device through Design for Testability

摘要

An electronic device is reliable if it is available for use most of the times throughout its life. The reliability can be affected by mishandling and use under abnormal operating conditions. High quality product cannot be achieved without proper verification and testing during the product development cycle. If the design is difficult to test, then it is very likely that most of the faults will not be detected before it is shipped to the customer. This paper describes how product quality can be improved by making the hardware design testable. Various designs for testability techniques were discussed. A three bit counter circuit was used to illustrate the benefits of design for testability by using scan chain methodology.