Functional-Level Fault Simulation with Concurrent and Parallel Mechanisms Using Object-Oriented VLSI Model

摘要

The functional-level test has been proposed as an alternative to reduce the com- plexity of test when VLSI gets larger and more complicated. It has been successful for circuits such as memories, PLAs and microprocessors. However, the functional-level test for general functional models has seldom been studied. This paper presents an object-oriented VLSI model and a functional0level fault simulation methodology for general functional model. based on the proposed VLSI model, FFS(Functional-level Fault Simulator) with friendly visual interface has been implemented on Microsoft Win- Dows platform by use of C ++.